Modelling of low-photon images

Abstract

Many methods of X-ray structural analysis have the problem of a large time interval for collecting the minimum permissible number of registered photons, the problem of background radiation and radiation load on the object under study and the detector. As a result, there is a search for methods to reduce the experiment time and methods to reduce the radiation load by lowering the threshold of the required minimum number of registered photons, and the development of algorithms for recognizing objects in images with a small number of photons.