Techniki zmniejszania poboru mocy wykorzystywane podczas wbudowanego samotestowania

Abstract

The power dissipation calculation of pseudorandom Test Pattern Generator (TPG) and Signature Analyzer (SA) in BIST is presented in this paper. The new idea, presented in the paper of test generation in BIST (Built-In Self-Test) allows reducing power dissipation during testing of the digital circuit. The main idea of proposed design is using flip-flops of type T.