SiO2:ZnO Thin Films Prepared by Sol-Gel Method and Deposited Using Ion-Beam Sputtering: Structure, Morphology, and Optical and Electrical Performance
dc.contributor.author | Al-Kamali, M. F. S. H. | |
dc.contributor.author | Boiko, A. A. | |
dc.contributor.author | Kovalenko, D. | |
dc.contributor.author | Al-Areqi, N. A. S. | |
dc.coverage.spatial | Taiz | ru_RU |
dc.date.accessioned | 2023-09-25T06:34:36Z | |
dc.date.available | 2023-09-25T06:34:36Z | |
dc.date.issued | 2022 | |
dc.identifier.citation | SiO2:ZnO Thin Films Prepared by Sol-Gel Method and Deposited Using Ion-Beam Sputtering: Structure, Morphology, and Optical and Electrical Performance / M. F. S. H. Al-Kamali [et. al.] // 2nd International Conference of Science and Administration - 2022 (2nd ICTSA-2022), 7-19 december 2022 : book of abstracts. – Taiz, Yemen : Taiz University, 2022. - P. 115. | ru_RU |
dc.identifier.uri | https://elib.gstu.by/handle/220612/28816 | |
dc.language.iso | en | ru_RU |
dc.publisher | Taiz University | ru_RU |
dc.subject | Ion- beam Sputtering | ru_RU |
dc.subject | Sol-gel | ru_RU |
dc.subject | Zinc ion | ru_RU |
dc.subject | Band gap | ru_RU |
dc.subject | SiO2:ZnO | ru_RU |
dc.subject | Morphology | ru_RU |
dc.subject | High-silica thin films | ru_RU |
dc.subject | XRD | ru_RU |
dc.subject | SEM | ru_RU |
dc.title | SiO2:ZnO Thin Films Prepared by Sol-Gel Method and Deposited Using Ion-Beam Sputtering: Structure, Morphology, and Optical and Electrical Performance | ru_RU |
dc.type | Article | ru_RU |